Electromigration-induced wave propagation on surfaces of voids in metallic thin films: Hopf bifurcation for high grain symmetry

Surface Science

Volumn 575, Issue 1-2, 2005, Pages

  Cho, Jaeseol ^a   Gungor, M Rauf ^a   Maroudas, Dimitrios ^a  

^a University of Massachusetts   (United States)

Author keywords

Models of non equilibrium phenomena; Models of non linear phenomena; Surface diffusion; Surface electrical transport (surface conductivity, surface recombination, etc.); Surface structure, morphology, roughness, and topography; Surface waves

Indexed keywords

CRYSTAL SYMMETRY; CRYSTALLINE MATERIALS; ELECTRIC CURRENTS; ELECTRIC FIELDS; ELECTROMAGNETIC WAVE PROPAGATION; FAILURE ANALYSIS; METALLIC FILMS; MORPHOLOGY; SINGLE CRYSTALS; SURFACE ROUGHNESS; SURFACE STRUCTURE; SURFACE WAVES; THIN FILMS;

MODELS OF NON-EQUILIBRIUM PHENOMENA; MODELS OF NON-LINEAR PHENOMENA; SURFACE DIFFUSION; SURFACE ELECTRICAL TRANSPORT;

SURFACES;

EID: 12244302229     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2004.11.011     Document Type: Article

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