Application of orientation microscopy in SEM and TEM for the study of texture formation during recrystallisation processes

Materials Science Forum

Volumn 495-497, Issue PART 1, 2005, Pages 3-12

  Zaefferer, Stefan ^a  

^a MAX PLANCK INSTITUT FÜR EISENFORSCHUNG GMBH   (Germany)

Author keywords

3D EBSD; Abnormal grain growth; EBSD; FIB; Nucleation mechanisms; Shear bands; TEM diffraction pattern

Indexed keywords

ANNEALING; COMPUTER SIMULATION; DATA STRUCTURES; MICROSTRUCTURE; NUCLEATION; SCANNING ELECTRON MICROSCOPY; SHEAR BANDS; TRANSMISSION ELECTRON MICROSCOPY;

ABNORMAL GRAIN GROWTH; NUCLEATION MECHANISMS; ORIENTATION MICROSCOPY; SPATIAL RESOLUTION;

RECRYSTALLIZATION (METALLURGY);

EID: 33845631721     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/0-87849-975-x.3     Document Type: Conference Paper

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