Investigation of the primary recrystallisation microstructure of cold rolled and annealed Fe 3% Si single crystals with Goss orientation

Materials Science Forum

Volumn 467-470, Issue I, 2004, Pages 129-134

  Dorner, Dorothée ^a   Lahn, Ludger ^b   Zaefferer, Stefan ^a  

^a MAX PLANCK INSTITUT FÜR EISENFORSCHUNG GMBH   (Germany)

^b THYSSENKRUPP STEEL EUROPE AG   (Germany)

Author keywords

Cold rolling; Goss texture; Microtexture; Primary recrystallisation; Silicon steel

Indexed keywords

ANNEALING; COLD ROLLING; ELECTRIC TRANSFORMERS; GRAIN BOUNDARIES; GRAIN GROWTH; IRON COMPOUNDS; MAGNETIC MATERIALS; MATHEMATICAL MODELS; MICROSTRUCTURE; SILICON STEEL; SINGLE CRYSTALS; TEXTURES; X RAY DIFFRACTION ANALYSIS;

ELECTRON BACK SCATTER DIFFRACTION (EBSD); GOSS TEXTURE; MICROTEXTURE; PRIMARY RECRYSTALLIZATION;

CRYSTALLIZATION;

EID: 17044376745     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.467-470.129     Document Type: Conference Paper

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