Investigation of the Correlation between Texture and Microstructure on a Submicrometer Scale in the TEM

Advanced Engineering Materials

Volumn 5, Issue 10, 2003, Pages 745-752

  Zaefferer, Stefan ^a  

^a MAX PLANCK INSTITUT FÜR EISENFORSCHUNG GMBH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; CRYSTAL DEFECTS; CRYSTAL ORIENTATION; DEFORMATION; NANOSTRUCTURED MATERIALS; SCANNING ELECTRON MICROSCOPY; STRUCTURE (COMPOSITION); TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON BACKSCATTER DIFFRACTION PATTERNS (EBSP); FIELD EMISSION GUNS (FEG);

TEXTURES;

EID: 0242580948     PISSN: 14381656     EISSN: None     Source Type: Journal    
DOI: 10.1002/adem.200320382     Document Type: Article

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