Automated crystal orientation mapping (ACOM) with a computer-controlled TEM by interpreting transmission kikuchi patterns

Materials Science Forum

Volumn 273-275, Issue , 1998, Pages 215-222

  Schwarzer, R A ^a   Sukkau, J ^a  

^a Inst F Metallkunde Metallphysik   (Germany)

Author keywords

Aggregate Function; BKD; Electron Diffraction; Image Processing; Pattern Recognition; TEM; TKD

Indexed keywords

CAMERAS; CHARGE COUPLED DEVICES; COMPUTER CONTROL; ELECTRON DIFFRACTION; FUNCTIONS; GRAIN BOUNDARIES; IMAGE PROCESSING; PATTERN RECOGNITION; TRANSMISSION ELECTRON MICROSCOPY;

AUTOMATED CRYSTAL ORIENTATION MAPPING (ACOM); BACKSCATTER KIKUCHI PATTERNS (BKP); TRANSMISSION KIKUCHI PATTERNS (TKP);

CRYSTAL ORIENTATION;

EID: 0031707235     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.273-275.215     Document Type: Article

References (12)

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