Study of the electrical cycling stressed large area Schottky diodes using I-V and noise measurements

Microelectronics Reliability

Volumn 47, Issue 1, 2007, Pages 51-58

  Jevtić, Milan M ^a   Hadži Vuković, Jovan M ^a  

^a UNIVERSITY OF BELGRADE   (Serbia)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; DEGRADATION; LEAKAGE CURRENTS; NATURAL FREQUENCIES; SCREENING; SIGNAL NOISE MEASUREMENT; STRESSES;

CONTACT IRREGULARITIES; CYCLING STRESS; DEGRADED DIODES; ELECTRICAL CYCLING;

SCHOTTKY BARRIER DIODES;

EID: 33845547129     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2006.03.013     Document Type: Article

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