|
|
Volumn 493, Issue 1-3, 2001, Pages 644-652
|
|
Gaussian distribution of inhomogeneous barrier height in Si Schottky barriers
|
|
Author keywords
Metal semiconductor interfaces; Schottky barrier; Silicon; Surface electronic phenomena (work function, surface potential, surface states, etc.)
|
|
Indexed keywords
CURRENT VOLTAGE CHARACTERISTICS;
FERMI LEVEL;
IONIZATION;
SEMICONDUCTOR JUNCTIONS;
SURFACE PHENOMENA;
SCHOTTKY BARRIERS (SB);
SEMICONDUCTING SILICON;
|
|
EID: 0035501293
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(01)01277-8 Document Type: Conference Paper |
|
Times cited : (15)
|
|
References (17)
|
