Electrical transport at a non-ideal CrSi2-Si junction

Solid-State Electronics

Volumn 44, Issue 1, 2000, Pages 41-48

  Aniltürk, Ö S ^a   Turan, R ^a  

^a MIDDLE EAST TECHNICAL UNIVERSITY   (Turkey)

Author keywords

[No Author keywords available]

Indexed keywords

CHROMIUM COMPOUNDS; CURRENT VOLTAGE CHARACTERISTICS; EMISSION SPECTROSCOPY; PHOTOEMISSION; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE MODELS; THERMAL EFFECTS;

INTERNAL PHOTOEMISSION SPECTROSCOPY; SCHOTTKY JUNCTION;

SEMICONDUCTOR JUNCTIONS;

EID: 0038355489     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(99)00204-X     Document Type: Article

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