Elastic properties of polycrystalline gold thin films: Simulation and X-ray diffraction experiments

Surface and Coatings Technology

Volumn 201, Issue 7 SPEC. ISS., 2006, Pages 4300-4304

  Faurie, D ^a   Castelnau, O ^b   Renault, P O ^a   Patriarche, G ^c   Brenner, R ^b   Le Bourhis, E ^a   Goudeau, Ph ^a  

^a UNIVERSITÉ DE POITIERS   (France)

^b UNIVERSITÉ PARIS 13   (France)

^c UNIV PARIS SUD   (France)

Author keywords

Anisotropy; Elastic properties; Gold; X ray diffraction

Indexed keywords

ANISOTROPY; COMPUTER SIMULATION; CRYSTAL MICROSTRUCTURE; ELASTICITY; GOLD; MATHEMATICAL MODELS; POLYCRYSTALLINE MATERIALS; RESIDUAL STRESSES; TENSILE TESTING; TEXTURES; X RAY DIFFRACTION ANALYSIS;

GOLD THIN FILMS; GRAIN ELASTIC INTERACTIONS; SYNCHROTRON X-RAY DIFFRACTION;

THIN FILMS;

ANISOTROPY; COMPUTER SIMULATION; CRYSTAL MICROSTRUCTURE; ELASTICITY; GOLD; MATHEMATICAL MODELS; POLYCRYSTALLINE MATERIALS; RESIDUAL STRESSES; TENSILE TESTING; TEXTURES; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

EID: 33751238810     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2006.08.037     Document Type: Article

References (27)

1. Shenoy V.B. Phys. Rev., B 71 (2005) 094104
2. Van Workum K., and de Pablo J.J. Phys. Rev., E 67 (2003) 031601
3. Badawi K.F., Villain P., Goudeau Ph., and Renault P.-O. Appl. Phys. Lett. 80 (2002) 4705
4. Yu D.Y.W., and Spaepen F. J. Appl. Phys. 95 (2004) 2991
5. Kalkmann A.J., Verbruggen A.H., and Janssen G.C.A.M. Appl. Phys. Lett. 78 (2001) 2673
6. Schiøtz J., Vegge T., Di Tolle F.D., and Jacobsen K.W. Phys. Rev., B 60 (1999) 11971
7. Eshelby J.D. Proc. R. Soc., A 241 (1957) 376
8. Kröner E. Z. Phys. 151 (1958) 504
9. Thompson C.V., and Carel R. J. Mech. Phys. Solids 44 (1996) 657
10. Welzel U., and Mittemeijer E.J. J. Appl. Phys. 93 (2003) 9001
11. Böhm J., Gruber P., Spolenak R., Stierle A., Wanner A., and Arzt E. Rev. Sci. Instrum. 75 (2004) 1110
12. Faurie D., Renault P.-O., Le Bourhis E., and Goudeau Ph. J. Appl. Phys. 98 (2005) 093511
13. Renault P.-O., Le Bourhis E., Villain P., Goudeau Ph., Badawi K.F., and Faurie D. Appl. Phys. Lett. 83 (2003) 473
14. Kamminga J.-D., de Keijser Th.H., Delhez R., and Mittemeijer E.J. J. Appl. Phys. 88 (2000) 6332
15. Debelle A., Abadias G., Michel A., and Jaouen C. Appl. Phys. Lett. 84 (2004) 5034
16. Hendrix B.C., and Yu L.G. Acta Mater. 46 (1998) 127
17. Letouzé N., Brenner R., Castelnau O., and Bechade J.L. Scr. Mater. 47 (2002) 595
18. Bunge H.J. Texture Analysis in Materials Science, London, Butterwoths (1982)
19. Matthies S., Priesmeyer H.G., and Daymond M.R. J. Appl. Crystallogr. 34 (2001) 585
20. D. Faurie, O. Castelnau, R. Brenner, P.-O. Renault, E. Le Bourhis, P. Goudeau, in preparation.
21. D. Faurie, Ph.D. thesis, University of Poitiers, France (2005).
22. Faurie D., Renault P.-O., Le Bourhis E., Villain P., Goudeau Ph., and Badawi K.F. Thin Solid Films 469-470 (2004) 201
23. Reuss A. Z. Angew. Math. Mech. 9 (1929) 49
24. Voigt W. Lehrbuch der Kristallphysik (1910), Verlag, Leipzig, Teubner
25. Welzel U., Freour S., and Mittemeijer E.J. Philos. Mag. 85 (2005) 2391
26. Kumar A., Welzel U., and Mittemeijer E.J. Acta Mater. 54 (2006) 1419
27. J. L. Hodeau, private communication.