Determination of the critical layer thickness in the InGaN/GaN heterostructures

Applied Physics Letters

Volumn 75, Issue 18, 1999, Pages 2776-2778

  Parker, C A ^a   Roberts, J C ^a   Bedair, S M ^a   Reed, M J ^a   Liu, S X ^a   El Masry, N A ^a  

^a Campus Box 7908   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000799441     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.125146     Document Type: Article

References (11)

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