Wave-optical analysis of sub-micron focusing of hard X-ray beams by reflective optics

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4782, Issue , 2002, Pages 271-276

  Yamauchi, K ^a   Yamamura, K ^a   Mimura, H ^a   Sano, Y ^a   Saito, A ^a   Kanaoka, M ^a   Endo, K ^a   Souvorov, A ^b   Yabashi, M ^b   Tamasaku, K ^c   Ishikawa, T ^c   Mori, Y ^a  

^a OSAKA UNIVERSITY   (Japan)

^b JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^c RIKEN   (Japan)

Author keywords

Coherent X ray; Hard X ray focusing; Wave optical simulation

Indexed keywords

COMPUTER SIMULATION; PHOTONS; SCANNING; X RAY MICROSCOPES;

WAVE-OPTICAL ANALYSIS;

MIRRORS;

EID: 0037964439     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.453752     Document Type: Conference Paper

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