X-ray scattering: A powerful probe of lattice strain in materials with small dimensions

Applied Surface Science

Volumn 253, Issue 1 SPEC. ISS., 2006, Pages 182-187

  Thomas, Olivier ^a   Loubens, Audrey ^a   Gergaud, Patrice ^a   Labat, Stéphane ^a  

^a CNRS   (France)

Author keywords

Nano structures; strain stress; X ray diffraction

Indexed keywords

ATOMIC PHYSICS; CRYSTALLOGRAPHY; MULTILAYERS; STRAIN MEASUREMENT; X RAY DIFFRACTION; X RAY SCATTERING;

ATOMIC DISPLACEMENTS; COHERENT DIFFRACTION; ELASTIC DISPLACEMENT FIELDS; MICRODIFFRACTION;

NANOSTRUCTURED MATERIALS;

EID: 33750526682     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.05.082     Document Type: Article

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