In situ synchrotron X-ray microdiffraction study of deformation behavior in polycrystalline coppers during uniaxial deformations

Scripta Materialia

Volumn 51, Issue 12, 2004, Pages 1183-1186

  Joo, H D ^a   Kim, J S ^a   Kim, K H ^b   Tamura, N ^c   Koo, Y M ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

^b Samsung Advanced Institute of Technology (SAIT)   (South Korea)

^c UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Microdiffraction; Plastic deformation; Polycrystal; Slip system; Tensile axis rotation

Indexed keywords

CHARGE COUPLED DEVICES; COPPER; MICROSCOPIC EXAMINATION; PLASTIC DEFORMATION; STRAIN; STRESS ANALYSIS; SYNCHROTRON RADIATION; TENSILE TESTING; X RAY DIFFRACTION ANALYSIS;

MICRODIFFRACTION; SLIP SYSTEMS; TENSILE AXIS ROTATION; UNIAXIAL DEFORMATIONS;

POLYCRYSTALLINE MATERIALS;

EID: 4644324142     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2004.07.003     Document Type: Article

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