The strain reduction and quality improvement in ZnO film by a 30° in-plane rotation with respect to the Al2O3 substrate

Materials Research Bulletin

Volumn 41, Issue 12, 2006, Pages 2198-2203

  Zhou, Shengqiang ^a   Wu, M F ^a   Yao, S D ^a   Lu, Y M ^b   Liu, Y C ^b  

^a PEKING UNIVERSITY   (China)

^b CHANGCHUN INSTITUTE OF OPTICS   (China)

Author keywords

B. Epitaxial growth; C. X ray diffraction; D. Crystal structure

Indexed keywords

ALUMINA; CRYSTAL STRUCTURE; EPITAXIAL GROWTH; STRAIN CONTROL; X RAY DIFFRACTION; ZINC OXIDE;

DEFECT DENSITY; LATTICE STRAIN; QUALITY IMPROVEMENT; STRUCTURAL CHARACTERIZATIONS;

THIN FILMS;

EID: 33750505627     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.materresbull.2006.04.032     Document Type: Article

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