Coupling surface temperature scanning and ultra-fast adaptive computing to thermally fully characterize complex three-dimensional electronic devices

Annual IEEE Semiconductor Thermal Measurement and Management Symposium

Volumn 2006, Issue , 2006, Pages 204-209

  Raad, Peter E ^a   Komarov, Pavel L ^a   Burzo, Mihai G ^a  

^a Southern Methodist University   (United States)

Author keywords

Inverse heat transfer problem; Multi scale physics; Self adaptive discretization; Surface temperature mapping; Thermoreflectance thermography; Ultra fast simulation

Indexed keywords

COMPUTATIONAL METHODS; COMPUTER SIMULATION; HEAT TRANSFER; INVERSE PROBLEMS; SURFACE MEASUREMENT; TEMPERATURE MEASUREMENT;

INVERSE HEAT TRANSFER PROBLEM; SELF-ADAPTIVE DISCRETIZATION; SURFACE TEMPERATURE MAPPING; THERMOREFLECTANCE THERMOGRAPHY;

ELECTRONIC EQUIPMENT;

EID: 33750143841     PISSN: 10652221     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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