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Volumn 369, Issue 7, 2001, Pages 231-235

Real time sub-micron thermal imaging using thermoreflectance

Author keywords

[No Author keywords available]

Indexed keywords

MICRO-HEATERS; SEMICONDUCTOR MICRO-COOLERS;

EID: 1542747901     PISSN: 02725673     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (10)

References (9)
  • 1
    • 0030086144 scopus 로고    scopus 로고
    • Thermal Imaging and Measurement Techniques for Electronic Materials and Devices
    • J. Kolzer, E. Oesterschulze, and G. Deboy, "Thermal Imaging and Measurement Techniques for Electronic Materials and Devices," Microelectronic Engineering, p.251-270, 1996.
    • (1996) Microelectronic Engineering , pp. 251-270
    • Kolzer, J.1    Oesterschulze, E.2    Deboy, G.3
  • 2
    • 0032071599 scopus 로고    scopus 로고
    • Short-time-scale Thermal Mapping of Microdevices using a Scanning Thermoreflectance Technique
    • May
    • K.E. Goodson and Y.S. Ju, "Short-time-scale Thermal Mapping of Microdevices using a Scanning Thermoreflectance Technique," Trans. of the ASME, p.306-313, May 1998.
    • (1998) Trans. of the ASME , pp. 306-313
    • Goodson, K.E.1    Ju, Y.S.2
  • 3
    • 0032673011 scopus 로고    scopus 로고
    • Temperature Measurement of Metal Lines under Current Stress by High Resolution Laser Probing
    • Feb
    • Quintard, Dilhaire, Phan, and Claeys. "Temperature Measurement of Metal Lines under Current Stress by High Resolution Laser Probing," IEEE Trans. on Instrumentation and Measurement, p.69-74, Feb 1999.
    • (1999) IEEE Trans. on Instrumentation and Measurement , pp. 69-74
    • Quintard1    Dilhaire2    Phan3    Claeys4
  • 4
    • 0032209093 scopus 로고    scopus 로고
    • Subsurface Microscopy of Biased Metal Oxide Semiconductor Field Effect Transistor Structures: Photothermal and Electroreflectance images
    • J. Batista, A Mansanares, EC DaSilva, M Pimentel, N Januzzi, D Fournier. "Subsurface Microscopy of Biased Metal Oxide Semiconductor Field Effect Transistor Structures: Photothermal and Electroreflectance images," Senors and Actuators A, 71:40-45, 1998.
    • (1998) Senors and Actuators A , vol.71 , pp. 40-45
    • Batista, J.1    Mansanares, A.2    Dasilva, E.C.3    Pimentel, M.4    Januzzi, N.5    Fournier, D.6
  • 5
    • 0027702378 scopus 로고
    • Temperature Measurements of Telecommunication Lasers on a Micrometre Scale
    • A Mansanares, D Fournier, A Boccara. "Temperature Measurements of Telecommunication Lasers on a Micrometre Scale", Electronics Letters, 29(23), p.2045-2047, 1993.
    • (1993) Electronics Letters , vol.29 , Issue.23 , pp. 2045-2047
    • Mansanares, A.1    Fournier, D.2    Boccara, A.3
  • 6
    • 0032606243 scopus 로고    scopus 로고
    • High Resolution Photothermal Imaging of High Frequency Using Visible Charge Couple Device Camera Associated with Multichannel Lock-in Scheme
    • Sept.
    • S Grauby, S Hole and D Fournier. "High Resolution Photothermal Imaging of High Frequency Using Visible Charge Couple Device Camera Associated with Multichannel Lock-in Scheme," Review of Scientific Instruments. P.3603-3608, Sept. 1999.
    • (1999) Review of Scientific Instruments , pp. 3603-3608
    • Grauby, S.1    Hole, S.2    Fournier, D.3
  • 7
    • 0001679456 scopus 로고
    • Piezoreflectivity of the Nobel Metals
    • August
    • Garfinkel, Tiemenn, Engler, "Piezoreflectivity of the Nobel Metals", Physical Review, August 1966.
    • (1966) Physical Review
    • Garfinkel1    Tiemenn2    Engler3
  • 8
    • 0000886827 scopus 로고    scopus 로고
    • Heterostructure Integrated Thermoinic Micro-Coolers
    • September
    • Ali Shakouri and John E. Bowers, "Heterostructure Integrated Thermoinic Micro-Coolers," Applied Physics Letters, 9(71), p. 1234-1236, September 1997.
    • (1997) Applied Physics Letters , vol.9 , Issue.71 , pp. 1234-1236
    • Shakouri, A.1    Bowers, J.E.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.