The use of a formal optimisation procedure in automatic parameter extraction of power semiconductor devices

PESC Record - IEEE Annual Power Electronics Specialists Conference

Volumn 2, Issue , 2003, Pages 822-827

  Bryant, A T ^a   Palmer, P R ^a   Hudgins, J L ^b   Santi, E ^b   Kang, X ^b  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b University of South Carolina   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTROMAGNETIC COMPATIBILITY; PARAMETER ESTIMATION; SEMICONDUCTOR DEVICE TESTING; SEMICONDUCTOR DIODES; SWITCHING SYSTEMS; WAVEFORM ANALYSIS;

AUTOMATIC PARAMETER EXTRACTION;

POWER ELECTRONICS;

EID: 0043159154     PISSN: 02759306     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)

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