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Volumn 2, Issue , 2003, Pages 1156-1161

A New Physics Based SPICE Model for NPT IGBTs

Author keywords

Device modeling; IGBT; Power semiconductor devices; Simulation

Indexed keywords

CHARGE CARRIERS; COMPUTER SIMULATION; ELECTRON MOBILITY; FINITE ELEMENT METHOD; INTEGRATED CIRCUIT LAYOUT; MATHEMATICAL MODELS; SIMULATORS;

EID: 1442353549     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (11)

References (16)
  • 1
    • 0032071510 scopus 로고    scopus 로고
    • Status and Trends of Power Semiconductor Device Models for Circuit Simulation
    • R. Kraus and H. Mattausch. Status and Trends of Power Semiconductor Device Models for Circuit Simulation. IEEE Trans. Power Electron., 13(3): p. 452465, 1998.
    • (1998) IEEE Trans. Power Electron. , vol.13 , Issue.3 , pp. 452465
    • Kraus, R.1    Mattausch, H.2
  • 2
    • 0028496730 scopus 로고
    • A Modular Concept for the Circuit Simulation of Bipolar Power Semiconductors
    • D. Metzner, T. Vogler and D. Schröder. A Modular Concept for the Circuit Simulation of Bipolar Power Semiconductors. IEEE Trans. Power Electron., 9(5): p. 506-513, 1994.
    • (1994) IEEE Trans. Power Electron. , vol.9 , Issue.5 , pp. 506-513
    • Metzner, D.1    Vogler, T.2    Schröder, D.3
  • 3
    • 0025497993 scopus 로고
    • An Improved Understanding for the Transient Operation of the Power Insulated Gate Bipolar Transistor (IGST)
    • A.R. Hefner. An Improved Understanding for the Transient Operation of the Power Insulated Gate Bipolar Transistor (IGST). IEEE Trans. Power Electron., 5(4): p. 459-468, 1990.
    • (1990) IEEE Trans. Power Electron. , vol.5 , Issue.4 , pp. 459-468
    • Hefner, A.R.1
  • 4
    • 0028497396 scopus 로고
    • An Experimentally Verified IGBT Model Implementation in the Saber Circuit Simulator
    • A.R. Hefner and D.M. Diebolt. An Experimentally Verified IGBT Model Implementation in the Saber Circuit Simulator. IEEE Trans. Power Electron., 9(5): p. 532-542, 1994.
    • (1994) IEEE Trans. Power Electron. , vol.9 , Issue.5 , pp. 532-542
    • Hefner, A.R.1    Diebolt, D.M.2
  • 7
    • 0028497802 scopus 로고
    • A Unified Method for Modeling Semiconductor Power Devices
    • H. Goebel. A Unified Method for Modeling Semiconductor Power Devices. IEEE Trans. Power Electron., 9(5): p. 497-505, 1994.
    • (1994) IEEE Trans. Power Electron. , vol.9 , Issue.5 , pp. 497-505
    • Goebel, H.1
  • 10
    • 0031147313 scopus 로고    scopus 로고
    • Modeling of Power Diodes with the Lumped-Charge Modeling Technique
    • C.L. Ma, P.O. Lauritzen and J. Sigg. Modeling of Power Diodes with the Lumped-Charge Modeling Technique. IEEE Trans. Power Electron., 12(3): p. 398405, 1997.
    • (1997) IEEE Trans. Power Electron. , vol.12 , Issue.3 , pp. 398405
    • Ma, C.L.1    Lauritzen, P.O.2    Sigg, J.3
  • 13
    • 0032658363 scopus 로고    scopus 로고
    • Using Power Diode Models for Circuit Simulations - A Comprehensive Review
    • C.M. Tan and K. Tseng. Using Power Diode Models for Circuit Simulations - A Comprehensive Review. IEEE Trans. Industrial Electron., 46(3): p. 637-645, 1999.
    • (1999) IEEE Trans. Industrial Electron. , vol.46 , Issue.3 , pp. 637-645
    • Tan, C.M.1    Tseng, K.2
  • 14
    • 0032794993 scopus 로고    scopus 로고
    • A New Analytical IGBT Model with Improved Electrical Characteristics
    • K. Sheng, S.J. Finney and B.W. Williams. A New Analytical IGBT Model with Improved Electrical Characteristics. IEEE Trans. Power Electron., 14(1): p. 98-107, 1999.
    • (1999) IEEE Trans. Power Electron. , vol.14 , Issue.1 , pp. 98-107
    • Sheng, K.1    Finney, S.J.2    Williams, B.W.3
  • 15
    • 0036641777 scopus 로고    scopus 로고
    • Investigation of the Power Dissipation during IGBT Turn-off using a New Physics-Based IGBT Compact Model
    • P.M. Igic, et al. Investigation of the Power Dissipation during IGBT Turn-off using a New Physics-Based IGBT Compact Model. Microelectronics Reliability, 42(7): p. 1045-1052, 2002.
    • (2002) Microelectronics Reliability , vol.42 , Issue.7 , pp. 1045-1052
    • Igic, P.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.