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Volumn 67, Issue 6, 1998, Pages 727-730

Dome-to-pyramid transition induced by alloying of Ge islands on Si(001)

Author keywords

[No Author keywords available]

Indexed keywords

ALLOYING; ANNEALING; CRYSTAL GROWTH; CRYSTAL ORIENTATION; DIFFUSION IN SOLIDS; NANOSTRUCTURED MATERIALS; SILICON WAFERS; STRAIN; STRESS ANALYSIS;

EID: 0032292334     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003390050845     Document Type: Article
Times cited : (88)

References (29)
  • 21
    • 19544383138 scopus 로고    scopus 로고
    • note
    • Rutherford backscattering measurements show that no Ge is lost from the sample during annealing


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.