SCOPUS 정보 검색 플랫폼

Physica Status Solidi (A) Applications and Materials Science

Volumn 203, Issue 12, 2006, Pages 3056-3062

Structural defects in homoepitaxial diamond layers grown on off-axis Ib HPHT substrates

(6) Bauer, T a Schreck, M a Hartwig J b Liu, X H c Wong, S P c Stritzker, B a

a UNIVERSITY OF AUGSBURG (Germany)

b EUROPEAN SYNCHROTRON RADIATION FACILITY (France)

c CHINESE UNIVERSITY OF HONG KONG (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

FULL WIDTH AT HALF MAXIMUM (FWHM); HIGH RESOLUTION X-RAY DIFFRACTION (HRXRD); HOMOEPITAXIAL DIAMOND LAYERS; MICROWAVE PLASMA CHEMICAL VAPOUR DEPOSITION (MWPCVD);

BIREFRINGENCE; CRYSTALS; MICROWAVES; OPTICAL MICROSCOPY; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; POLYCRYSTALLINE MATERIALS; X RAY DIFFRACTION ANALYSIS;

DIAMOND FILMS;

EID: 33749316355 PISSN: 18626300 EISSN: 18626319 Source Type: Journal
DOI: 10.1002/pssa.200671103 Document Type: Conference Paper

Times cited : (25)

References (14)

1
- 0037031719
- J. Isberg, J. Hammersberg, E. Johansson, T. Wikström, D. J. Twitchen, A. J. Whitehead, S. E. Coe, and G. A. Scarsbrook, Science 297, 1670 (2002).
- (2002) Science , vol.297 , pp. 1670
- Isberg, J.¹ Hammersberg, J.² Johansson, E.³ Wikström, T.⁴ Twitchen, D.J.⁵ Whitehead, A.J.⁶ Coe, S.E.⁷ Scarsbrook, G.A.⁸

2
- 18544384117
- A. Tallaire, J. Achard, F. Silva, R. S. Sussmann, and A. Gicquel, Diam. Relat. Mater. 14, 249 (2005).
- (2005) Diam. Relat. Mater. , vol.14 , pp. 249
- Tallaire, A.¹ Achard, J.² Silva, F.³ Sussmann, R.S.⁴ Gicquel, A.⁵

3
- 33745513403
- G. Bogdan, M. Nesládek, J. D'Haen, J. Maes, V. V. Moshchalkov, K. Haenen, and M. D'Olieslaeger, phys. stat. sol. (a) 202, 2066 (2005).
- (2005) Phys. Stat. Sol. (A) , vol.202 , pp. 2066
- Bogdan, G.¹ Nesládek, M.² D'Haen, J.³ Maes, J.⁴ Moshchalkov, V.V.⁵ Haenen, K.⁶ D'Olieslaeger, M.⁷

4
- 0036789915
- C. S. Yan, Y. K. Vohra, H. K. Mao, and R. J. Hemley, Proc. Natl. Acad. Sci. USA 99, 12523 (2002).
- (2002) Proc. Natl. Acad. Sci. USA , vol.99 , pp. 12523
- Yan, C.S.¹ Vohra, Y.K.² Mao, H.K.³ Hemley, R.J.⁴

5
- 18444391219
- T. Bauer, M. Schreck, H. Sternschulte, and B. Stritzker, Diam. Relat. Mater. 14, 266 (2005).
- (2005) Diam. Relat. Mater. , vol.14 , pp. 266
- Bauer, T.¹ Schreck, M.² Sternschulte, H.³ Stritzker, B.⁴

6
- 33745269219
- T. Bauer, M. Schreck, and B. Stritzker, Diam. Relat. Mater. 15, 472 (2006).
- (2006) Diam. Relat. Mater. , vol.15 , pp. 472
- Bauer, T.¹ Schreck, M.² Stritzker, B.³

7
- 0004108666
- Taylor & Francis, London
- D. K. Bowen and B. K. Tanner, High Resolution X-Ray Diffractometry and Topography (Taylor & Francis, London, 1998).
- (1998) High Resolution X-ray Diffractometry and Topography
- Bowen, D.K.¹ Tanner, B.K.²

8
- 84857441878
- http://www.esrf.fr/UsersAndScience/Experiments/Imagmg/ID19/.

9
- 84857441879
- http://www.esrf.fr/UsersAndScience/Experiments/Imaging/ID19/Techniques/ Difrraction/Overview/.

10
- 0344515261
- H. J. Peng, S. P. Wong, Y. W. Lai, X. H. Liu, H. P. Ho, and Shounan Zhao, Rev. Sci. Instrum. 74, 4745 (2003).
- (2003) Rev. Sci. Instrum. , vol.74 , pp. 4745
- Peng, H.J.¹ Wong, S.P.² Lai, Y.W.³ Liu, X.H.⁴ Ho, H.P.⁵ Zhao, S.⁶

11
- 0006500605
- W. L. Bond and J. Andrus, Phys. Rev. 101, 1211 (1956).
- (1956) Phys. Rev. , vol.101 , pp. 1211
- Bond, W.L.¹ Andrus, J.²

12
- 0005305896
- A. R. Lang, Nature 213, 248 (1967).
- (1967) Nature , vol.213 , pp. 248
- Lang, A.R.¹

13
- 0000341350
- J. Stiegler, T. Lang, M. Nygard-Ferguson, Y. von Kaenel, and E. Blank, Diam. Relat. Mater. 5, 226 (1996).
- (1996) Diam. Relat. Mater. , vol.5 , pp. 226
- Stiegler, J.¹ Lang, T.² Nygard-Ferguson, M.³ Von Kaenel, Y.⁴ Blank, E.⁵

14
- 0031103779
- J. Michler, J. Stiegler, Y. von Kaenel, P. Moeckli, W. Dorsch, D. Stenkamp, and E. Blank, J. Cryst. Growth 172, 404 (1997).
- (1997) J. Cryst. Growth , vol.172 , pp. 404
- Michler, J.¹ Stiegler, J.² Von Kaenel, Y.³ Moeckli, P.⁴ Dorsch, W.⁵ Stenkamp, D.⁶ Blank, E.⁷

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.