Force gradient detection under vacuum on the basis of a double pass method

Review of Scientific Instruments

Volumn 77, Issue 9, 2006, Pages

  Portes, L ^a   Girard, P ^a   Arinero, R ^a   Ramonda, M ^b  

^a UNIVERSITÉ MONTPELLIER II   (France)

^b UNIV MONTPELLIER   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTROSTATICS; FORCE MEASUREMENT; PHASE SHIFT; PROTECTIVE ATMOSPHERES;

DOUBLE PASS METHOD; FLEXURE MODES; FORCE GRADIENT DETECTION; GRADIENT DETECTION;

VACUUM APPLICATIONS;

EID: 33749315604     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2336104     Document Type: Article

References (25)

1. F. J. Giessibl, Rev. Mod. Phys. 75, 949 (2003).
2. T. Albrecht, P. Grutter, D. Home, and D. Rugar, J. Appl. Phys. 69, 668 (1991).
3. Y. Martin, C. C. Williams, and H. K. Wickramasinghe, J. Appl. Phys. 61, 4723 (1987).
4. B. D. Terris, J. E. Stern, D. Rugar, and H. J. Mamin, Phys. Rev. Lett. 63, 2669 (1989).
5. Y. Liang, D. A. Bonnel, W. D. Goodhue, D. D. Rathman, and C. O. Bolzer, Appl. Phys. Lett. 66, 1147 (1995).
6. P. Girard, M. Ramonda, and D. Saluel, J. Vac. Sci. Technol. B 20, 1348 (2002).
7. S. Belaidi, P. Girard, and G. Leveque, J. Appl. Phys. 81, 1 (1997).
8. M. Saint Jean, S. Hudlet, C. Guthmann, and J. Berger, J. Appl. Phys. 86, 5245 (1999).
9. P. Girard, A. N. Titkov, M. Ramonda, Ph. Cadet, and M. S. Dunaevskii, in STM'03 Conference, Conference Proceedings, Eindhoven, 21-25 July 2003 (Eindhoven University, The Netherlands, Eindhoven, 2003);
10. P. Girard and A. N. Titkov, in Applied Scanning II, edited by B. Bhushan and H. Fuchs (Springer, Heidelberg, 2006), pp. 283-320.
11. H. Bluhm, T. Inoue, and M. Salmeron, Surf. Sci. 462, L599 (2000).
12. A. Kikukawa, S. Osaka, and R. Imura, Rev. Sci. Instrum. 67, 1463 (1996).
13. S. Kitamura and M. Iwatsuki, Appl. Phys. Lett. 72, 3154 (1998).
14. Ch. Sommerhalter, Th. W. Matthes, Th. Glatzel, A. Jäger-Waldau, and M. Ch. Lux Steiner, Appl. Phys. Lett. 75, 296 (1999).
15. S. Kitamura and M. Iwatsuki, Jpn. J. Appl. Phys., Part 2 35, L 668 (1996).
16. T. D. Krauss and L. E. Brus, Phys. Rev. Lett. 83, 4840 (1999).
17. S. Saraf, M. Molotskii, and Y. Rosenwaks, Appl. Phys. Lett. 86, 172104 (2005).
18. A. V. Ankudinov, V. P. Evtikhiev, E. Yu. Kotelnikov, A. N. Tikkov, and R. Laiho, J. Appl. Phys. 93, 432 (2003).
19. M. Azize, P. Girard, R. Teissier, A. N. Baranov, and A. Joullié, J. Vac. Sci. Technol. B 21, 2151 (2003).
20. Th. Glatzel, S. Sadewasser, and M. Ch. Lux Steiner, Appl. Surf. Sci. 210, 84 (2003).
21. U. Zerweck, C. Loppacher, T. Otto, S. Grafström, and L. M. Eng, Phys. Rev. B 71, 125424 (2005).
22. M. J. Gordon and T. Baron, Phys. Rev. B 72, 165420 (2005).
23. E. Volterra and E. C. Zachmanoglou, Dynamics of Vibrations (E. Merril Books, Columbus, OH, 1965).
24. R. W. Stark and W. M. Heckl, Surf. Sci. 457, 219 (2000).
25. O. Sahin and A. Atalar, Appl. Phys. Lett. 79, 4445 (2001).