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Volumn 6268 II, Issue , 2006, Pages

Successful completion of SIM-PlanetQuest technology

Author keywords

Control; Interferometry; Lasers; Metrology; Nanometer; Optics; Picometer; Pointing

Indexed keywords

LASER METROLOGY SYSTEMS; NANOMETERS; PICOMETER; POINTING;

EID: 33749243462     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.670849     Document Type: Conference Paper
Times cited : (39)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.