Very high-precision absolute surface metrology gauges for building and qualifying SIM testbed interferometer compound optics

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4852, Issue 1, 2002, Pages 355-369

  Gürsel, Yekta ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Absolute surface gauges; Retro reflector; Siderostat; Spaceborne interferometry

Indexed keywords

INTERFEROMETERS; MIRRORS; SPACE RESEARCH; SPACECRAFT;

MICRO-ARC-SECOND METROLOGY TESTBED; RETRO-REFLECTOR; SIDEROSTAT; SURFACE METROLOGY;

INTERFEROMETRY;

EID: 0037950593     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.460882     Document Type: Conference Paper

References (4)

1. E. Schmidtlin and S. Shaklan, JPL mam-lib docushare internal library, mam-lib.jpl.nasa.gov/EngineeringDocuments/MAM1/Alignment/CC-Sid alignment images, November 11, 2000.
2. F. Snell, D. Phillion, G. Sommargen, and E. Campbell, New Interferometer Measures to Atomic Dimensions, in Science and Technology Review, Lawrence Livermore Laboratory, University of California, p. 6-7 October 1997.
3. B.C. Holmes, Private communication, December-April 2002.
4. B.E. Hines, C.E. Bell, R. Goullioud, R. Spero, G.W. Neat, T.J. Shen, Micro-arcsecond metrology (MAM) testbed overview, in Proceedings of SPIE Conference on Interferometry in Space, Vol. 4852, 2002.