MAM testbed detail description and alignment

IEEE Aerospace Conference Proceedings

Volumn 4, Issue , 2004, Pages 2191-2200

  Goullioud, R ^a   Shen, T J ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MICRO-ARCSECOND METROLOGY (MAM) TESTBED; OPTICAL PATHLENGTH DIFFERENCE (OPD); SPACE INTERFEROMETER MISSION (SIM); TESTBED;

ALIGNMENT; CHARGE COUPLED DEVICES; COMPUTER SIMULATION; LIGHT SOURCES; MIRRORS; OPTICAL DEVICES; PROJECT MANAGEMENT; SENSORS; TRACKING (POSITION); VACUUM APPLICATIONS;

INTERFEROMETERS;

EID: 11244354339     PISSN: 1095323X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/AERO.2004.1368012     Document Type: Conference Paper

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