Opto/mechanical design of the micro-arcsecond metrology testbed interferometer

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3350, Issue , 1998, Pages 89-99

  Carlson, Andrew E ^a   Shaklan, Stuart B ^a   Bartos, Randall D ^a   Azevedo, Steven L ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Angle tracking; Interferometer; Metrology; Optical delay; Precision optics

Indexed keywords

ASTROPHYSICS; CHARGE COUPLED DEVICES; INTEGRATED CIRCUITS; INTERFEROMETERS; LIGHT; MEASUREMENTS; OPTICAL INSTRUMENTS; SIGNAL PROCESSING; TEST FACILITIES; TESTBEDS;

ANGLE TRACKING; INTERFEROMETER; METROLOGY; OPTICAL DELAY; PRECISION OPTICS;

INTERFEROMETRY;

EID: 58749109601     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.317183     Document Type: Conference Paper

References (2)

1. S. Shaklan, S. Azevedo, R. Bartos, A. Carlson, Y. Gursel, P. Halverson, A. Kuhnert, Y. Lin, R. Savedra, E. Schmidtlin, "The micro-arcsecond metrology testbed (MAM)," Proceedings of SPIE Conf. On Astronomical Interferometry, ed. R. Reasenberg, Vol. 3350, Kona, 1998.
2. Kuhnert, S. Shaklan, Y. Gursel, S. Azevedo, Y. Lin, "Metrology system for the micro-arcsecond metrology testbed," Proceedings of SPIE Conf. on Astronomical Interferometry, ed. R. Reasenberg, Vol. 3350, Kona, 1998.