Metrology for the micro-arcsecond metrology testbed

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3350, Issue , 1998, Pages 100-108

  Kuhnert, Andreas C ^a   Shaklan, Stuart B ^a   Gursel, Yekta ^a   Azevedo, Steven L ^a   Lin, Yao ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Heterodyne interferometer; Interferometer; Interferometry; Metrology; Picometer

Indexed keywords

ASTROPHYSICS; HETERODYNING; INTERFEROMETERS; LASERS; LIGHT; LIGHT SOURCES; LIGHTING; MEASUREMENTS; MIRRORS; NEODYMIUM LASERS; OPTICAL INSTRUMENTS; SPACE APPLICATIONS; TEST FACILITIES; THICKNESS MEASUREMENT;

BEAM SPLITTERS; COMMON-PATH; CROSS TALKS; HETERODYNE INTERFEROMETER; INTERFEROMETER; INTERFEROMETER MIRRORS; LASER LIGHT; METROLOGY; METROLOGY SYSTEMS; ND : YAG LASERS; PATH LENGTHS; PICOMETER; RELATIVE LENGTH; SPACE INTERFEROMETRY MISSION (SIM); TEMPERATURE CHANGING; TEST BEDS;

INTERFEROMETRY;

EID: 58749097243     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.317185     Document Type: Conference Paper

References (12)

1. th, 1998.
2. Gursel, Y., SPIE Vol. 2200, p 27, 1994.
3. th, 1998.
4. Drever, R.W.P. et al, Appl. Phys., B31, p. 97, 1993,
5. and Zucker, M.E., California Institute of Technology Ph.D. Thesis, 1989.
6. th, 1998.
7. Bobroff, N., Applied Optics, Vol. 26, No. 13, p. 2676, 1987.
8. DeFreitas, J.M., Player, M.A., J. Mod. Opt., Vol. 42, No. 9, p. 1875, 1990.
9. Wenmei, H., Wilkening, G., Prec. Eng., Vol. 14, No.2, p. 91, 1992.
10. th, 1998.
11. th, 1998.
12. th, 1998.