Metrology for spatial interferometry IV

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3116, Issue , 1997, Pages 10-24

  Gürsel, Yekta ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GAGES; INSTRUMENTS; INTERFEROMETERS; INTERFEROMETRY; OPTICAL INSTRUMENTS; REFLECTION; SPACE APPLICATIONS; SPACECRAFT; SPACECRAFT PROPULSION; THICKNESS MEASUREMENT;

3 DIMENSIONAL; ABSOLUTE METROLOGY; AUTOMATIC ALIGNMENT (AA); HIGH RESOLUTIONS; SPACE INTERFEROMETRY MISSION (SIM);

MEASUREMENTS;

EID: 0003894188     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.293333     Document Type: Conference Paper

References (7)

1. Y. Gürsel. Laser metrology gauges for OSI, in Proceedings of SPIE conference on Spaceborne Interferornetry, Vol. 1947, p. 188-197, 1993.
2. Y. Gürsel. Metrology for spatial interferometry, in Proceedings of SPIE conference on Amplitude and Intensity Spatial Interferometry, Vol. 2200, p. 27-34, 1994.
3. Y. Gürsel. Metrology for spatial interferometry II, in Proceedings of SPIE conference on Spaceborne Interferometry II, Vol. 2477, p. 240-258, 1995.
4. Y. Gürsel. Metrology for spatial interferometry III, in Proceedings of SPIE conference on Space Telescopes and Instruments IV, Vol. 2807, p. 148-161, 1996.
5. Modeling and Analysis for Controlled Optical Systems, User Manual, US Government Version, Version 2.0, Jet Propulsion Laboratory, California Institute of Technology, January 25, 1996. No author is listed.
6. A similar definition to the one given in the text is used by the commercial GLAD diffraction analysis program.
7. Hines, B., Colavita, M. M., Wallace, J. K., Poulsen, A., "Sub-nanometer laser metrology - some techniques and models", in Proceedings of High Resolution Imaging by Interferometry II, ESO, Garching, Germany, 1991.