Metrology for spatial interferometry V

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3350, Issue , 1998, Pages 571-587

  Gürsel, Yekta ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; ASTROPHYSICS; ERRORS; GAGES; INTERFEROMETERS; JITTER; MEASUREMENT ERRORS; MEASUREMENTS; OPTICAL INSTRUMENTS; SPACE APPLICATIONS; SPACECRAFT; THICKNESS MEASUREMENT; THREE DIMENSIONAL;

3D METROLOGY; ABSOLUTE METROLOGY; END POINT (EP); HIGH RESOLUTIONS; LIGHT BEAMS; MEASUREMENT SYSTEMS; SPACE INTERFEROMETRY MISSION (SIM); SPACECRAFT DESIGNS; WARPAGE;

INTERFEROMETRY;

EID: 0003763531     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.317175     Document Type: Conference Paper

References (14)

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