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Volumn 2005, Issue , 2005, Pages 491-494

C-band single-chip GaN-FET power amplifiers with 60-W output power

Author keywords

C band; FET; GaN; Power amplifier

Indexed keywords

CHIP SCALE PACKAGES; FIELD EFFECT TRANSISTORS; MICROPROCESSOR CHIPS; NETWORKS (CIRCUITS); POWER CONTROL; SEMICONDUCTING GALLIUM ARSENIDE;

EID: 33749236655     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MWSYM.2005.1516637     Document Type: Conference Paper
Times cited : (21)

References (13)
  • 11
    • 0001285050 scopus 로고    scopus 로고
    • Reliability of metal semiconductor field-effect transistor using GaN at high temperature
    • S. Yoshida and J. Suzuki, "Reliability of metal semiconductor field-effect transistor using GaN at high temperature," J. App. Phys.,vol.84, 1998, pp.2940-2942.
    • (1998) J. App. Phys. , vol.84 , pp. 2940-2942
    • Yoshida, S.1    Suzuki, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.