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Volumn 51, Issue 18, 2006, Pages 3674-3679

Nanopatterning of an organic monolayer covered Si (1 1 1) surfaces by atomic force microscope scratching

Author keywords

AFM; Copper electrodeposition; Copper immersion platting; Nanopatterning; Organic monolayer

Indexed keywords

ATOMIC FORCE MICROSCOPY; AUGER ELECTRON SPECTROSCOPY; COPPER DEPOSITS; DIAMONDS; ELECTRODEPOSITION; HYDROGEN; MONOLAYERS; NANOSTRUCTURED MATERIALS; SCANNING ELECTRON MICROSCOPY;

EID: 33748878416     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2005.10.030     Document Type: Article
Times cited : (12)

References (29)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.