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Volumn 87, Issue 17, 2005, Pages 1-3
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Lateral electron transport in Cu(In,Ga)Se 2 investigated by electro-assisted scanning tunneling microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRON DIFFUSION;
ELECTRON TRANSPORT;
COPPER COMPOUNDS;
ELECTRON BEAMS;
GRAIN BOUNDARIES;
SCANNING TUNNELING MICROSCOPY;
CHARGE TRANSFER;
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EID: 28344434012
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.2119422 Document Type: Article |
Times cited : (22)
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References (9)
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