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Volumn 2006, Issue , 2006, Pages 219-222

Electrothermal analysis and optimization techniques for nanoscale integrated circuits

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; FINITE DIFFERENCE METHOD; FINITE ELEMENT METHOD; GREEN'S FUNCTION; OPTIMIZATION; THERMAL EFFECTS; THERMOANALYSIS;

EID: 33748612424     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1118299.1118359     Document Type: Conference Paper
Times cited : (27)

References (25)
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  • 3
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    • ILLIADS-T: An electrothermal timing simulator for temperature-sensitive reliability diagnosis of CMOS VLSI chips
    • August
    • Y. K. Cheng, P. Raha, C. C. Teng, E. Rosenbaum, and S.-M. Kang. ILLIADS-T: An electrothermal timing simulator for temperature-sensitive reliability diagnosis of CMOS VLSI chips. IEEE Transactions on Computer-Aided Design, 17(8):668-681, August 1998.
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    • Cheng, Y.K.1    Raha, P.2    Teng, C.C.3    Rosenbaum, E.4    Kang, S.-M.5
  • 4
    • 0036908379 scopus 로고    scopus 로고
    • 3-D thermal-ADI: A linear-time chip level transient thermal simulator
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    • T.-Y. Wang and C. C.-P. Chen. 3-D thermal-ADI: A linear-time chip level transient thermal simulator. IEEE Transactions on Computer-Aided Design, 21(12):1434-1445, December 2002.
    • (2002) IEEE Transactions on Computer-aided Design , vol.21 , Issue.12 , pp. 1434-1445
    • Wang, T.-Y.1    Chen, C.C.-P.2
  • 5
    • 0033871060 scopus 로고    scopus 로고
    • Cell-level placement for improving subtrate thermal distribution
    • February
    • C. Tsai and S. Kang. Cell-level placement for improving subtrate thermal distribution. IEEE Transactions on Computer-Aided Design, 19(2):253-266, February 2000.
    • (2000) IEEE Transactions on Computer-aided Design , vol.19 , Issue.2 , pp. 253-266
    • Tsai, C.1    Kang, S.2
  • 14
    • 84861418911 scopus 로고    scopus 로고
    • Fast computation of the temperature distribution in vlsi chips using the discrete cosine transform and table look-up
    • Y. Zhan and S. S. Sapatnekar. Fast computation of the temperature distribution in vlsi chips using the discrete cosine transform and table look-up. In Proceedings of the Asia/South Pacific Design Automation Conference, pages 87-92, 2005.
    • (2005) Proceedings of the Asia/South Pacific Design Automation Conference , pp. 87-92
    • Zhan, Y.1    Sapatnekar, S.S.2
  • 15
    • 0030110592 scopus 로고    scopus 로고
    • Modeling and analysis of substrate coupling in integrated circuits
    • March
    • R. Gharpurey and R. G. Meyer. Modeling and analysis of substrate coupling in integrated circuits. IEEE Journal of Solid-State Circuits, 17(4):305-315, March 1996.
    • (1996) IEEE Journal of Solid-State Circuits , vol.17 , Issue.4 , pp. 305-315
    • Gharpurey, R.1    Meyer, R.G.2
  • 20
    • 0036858210 scopus 로고    scopus 로고
    • Adaptive Body Bias for reducing impacts of die-to-die and within-die parameter variations on microprocessor frequency and leakage
    • November
    • J. W. Tschanz, J.T. Kao, S. G. Narendra, R. Nair, D.A. Antoniadis, A.P. Chandrakasan, and V. De. Adaptive Body Bias for reducing impacts of die-to-die and within-die parameter variations on microprocessor frequency and leakage. IEEE Journal of Solid-State Circuits, 37(11):1396-1402, November 2002.
    • (2002) IEEE Journal of Solid-state Circuits , vol.37 , Issue.11 , pp. 1396-1402
    • Tschanz, J.W.1    Kao, J.T.2    Narendra, S.G.3    Nair, R.4    Antoniadis, D.A.5    Chandrakasan, A.P.6    De, V.7
  • 22
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    • Negative bias temperature instability: Road to cross in deep submicron semiconductor manufacturing
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    • Schroder, D.K.1    Babcock, J.A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.