Scanning electrochemical microscope observation of defects in a hexadecanethiol monolayer on gold with shear force-based tip-substrate positioning

Langmuir

Volumn 22, Issue 18, 2006, Pages 7923-7927

  Yamada, Hiroshi ^a   Ogata, Mitsuko ^a   Koike, Tohru ^a  

^a NATIONAL DEFENSE ACADEMY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CYCLIC VOLTAMMETRY; DEFECTS; ELECTRIC CURRENTS; ELECTROCHEMICAL ELECTRODES; GOLD; MICROSCOPIC EXAMINATION; MONOLAYERS; SURFACE PROPERTIES;

DISK ELECTRODES; ELECTRON TRANSFER; SCANNING ELECTROCHEMICAL MICROSCOPY (SECM); VOLTAMMOGRAMS;

ORGANIC COMPOUNDS;

GOLD; HEXADECANETHIOL; THIOL DERIVATIVE;

ARTICLE; CHEMISTRY; ELECTROCHEMISTRY; ELECTRODE; MICROSCOPY;

ELECTROCHEMISTRY; ELECTRODES; GOLD; MICROSCOPY; SULFHYDRYL COMPOUNDS;

EID: 33748524501     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la0613171     Document Type: Article

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