Easy-to-use unglued tip replacement near-field optical microscope with piezoelectric shear force detection

Review of Scientific Instruments

Volumn 71, Issue 9, 2000, Pages 3441-3443

  Mulin, D ^a   Vannier, C ^a   Bainier, C ^a   Courjon, D ^a   Spajer, M ^a  

^a UNIVERSITÉ DE FRANCHE COMTÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0346672514     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1287632     Document Type: Article

References (9)

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