메뉴 건너뛰기




Volumn 38, Issue 12, 2003, Pages 2077-2086

Impact of Capacitor Dielectric Relaxation on a 14-bit 70-MS/s Pipeline ADC in 3-V BiCMOS

Author keywords

Analog to digital converters (ADCs); Dielectric relaxation; Pipelined architecture; Silicon germanium BiCMOS; Switched caDacitor circuits

Indexed keywords

ABSORPTION; ACOUSTIC NOISE; ALGORITHMS; AMPLIFICATION; CAPACITORS; CMOS INTEGRATED CIRCUITS; CODE DIVISION MULTIPLE ACCESS; COMPUTER SIMULATION; DIELECTRIC RELAXATION; HYSTERESIS; OPERATIONAL AMPLIFIERS; OPTIMIZATION; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SEMICONDUCTING GERMANIUM; SEMICONDUCTING SILICON;

EID: 0346972311     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSSC.2003.819168     Document Type: Conference Paper
Times cited : (28)

References (14)
  • 2
    • 0030080754 scopus 로고    scopus 로고
    • Measurement of dielectric absorption of capacitors and analysis of its effects on VCO's
    • Feb
    • J. C. Kuenen and G.C.M. Meijer, "Measurement of dielectric absorption of capacitors and analysis of its effects on VCO's," IEEE Trans. Instrum. Meas., vol. 45, pp. 89-97, Feb. 1996.
    • (1996) IEEE Trans. Instrum. Meas. , vol.45 , pp. 89-97
    • Kuenen, J.C.1    Meijer, G.C.M.2
  • 5
    • 0348128237 scopus 로고    scopus 로고
    • A 12 b 80 MS/s pipeline ADC core with 190 mW consumption from 3 V in 0. 18 μm digital CMOS
    • Florence, Italy, Sept
    • A. Loloee, A. Zanchi, H. Jin, S. Shehata, and E. Bartolome, "A 12 b 80 MS/s pipeline ADC core with 190 mW consumption from 3 V in 0.18 μm digital CMOS," in Proc. ESSCIRC, Florence, Italy, Sept. 2002, pp. 467-470.
    • (2002) Proc. ESSCIRC , pp. 467-470
    • Loloee, A.1    Zanchi, A.2    Jin, H.3    Shehata, S.4    Bartolome, E.5
  • 8
    • 0033097001 scopus 로고    scopus 로고
    • Experimental method for the determination of the energy distribution of stress-induced oxide traps
    • Mar
    • A. S. Spinelli, A. L. Lacaita, M. Rigamonti, and G. Ghidini, "Experimental method for the determination of the energy distribution of stress-induced oxide traps," IEEE Electron Device Lett., vol. 20, pp. 106-108, Mar. 1999.
    • (1999) IEEE Electron Device Lett. , vol.20 , pp. 106-108
    • Spinelli, A.S.1    Lacaita, A.L.2    Rigamonti, M.3    Ghidini, G.4
  • 10
    • 0346867743 scopus 로고    scopus 로고
    • Texas Instruments, Inc., Dallas, TX, Internal Communication, Mar
    • B. Atwell, "Dielectric absorption," Texas Instruments, Inc., Dallas, TX, Internal Communication, Mar. 2001.
    • (2001) Dielectric Absorption
    • Atwell, B.1
  • 11
    • 0035306945 scopus 로고    scopus 로고
    • Integra-differential equation of absorptive capacitors
    • Apr
    • R. Robert and S. M. Berleze, "Integra-differential equation of absorptive capacitors," IEEE Trans. Dielect. Elect. Insulation, vol. 8, pp. 244-247, Apr. 2001.
    • (2001) IEEE Trans. Dielect. Elect. Insulation , vol.8 , pp. 244-247
    • Robert, R.1    Berleze, S.M.2
  • 12
    • 0347498285 scopus 로고
    • An analysis of certain errors in electronic differential analyzers, II - Capacitor dielectric absorption
    • Mar
    • P. C. Dow, "An analysis of certain errors in electronic differential analyzers, II - Capacitor dielectric absorption," IRE Trans. Electron. Comput.,pp. 17-22, Mar. 1958.
    • (1958) IRE Trans. Electron. Comput. , pp. 17-22
    • Dow, P.C.1
  • 13
    • 0028384568 scopus 로고
    • Characterization, modeling, and minimization of transient threshold voltage shifts in MOSFET's
    • Mar
    • T. L. Tewksbury and H.-S. Lee, "Characterization, modeling, and minimization of transient threshold voltage shifts in MOSFET's," IEEE J. Solid-State Circuits, vol. 28, pp. 239-252, Mar. 1994.
    • (1994) IEEE J. Solid-state Circuits , vol.28 , pp. 239-252
    • Tewksbury, T.L.1    Lee, H.-S.2
  • 14
    • 0038757998 scopus 로고    scopus 로고
    • Measurement and SPICE prediction of sub-picosecond clock jitter in A/D converters
    • Bangkok. Thailand
    • A. Zanchi, I. Papantonopoulos, and F. Tsay, "Measurement and SPICE prediction of sub-picosecond clock jitter in A/D converters," in Proc. IEEE Int. Symp, Circuits and Systems, vol. 5, Bangkok. Thailand, May 2003, pp. 557-560.
    • (2003) Proc. IEEE Int. Symp, Circuits and Systems , vol.5 , pp. 557-560
    • Zanchi, A.1    Papantonopoulos, I.2    Tsay, F.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.