-
1
-
-
0025533492
-
The effect of dielectric relaxation on charge-redistribution A/D converters
-
Dec
-
J. W. Fattaruso, M. De Wit, G. Warwar, K.-S. Tan, and R. K. Hester, "The effect of dielectric relaxation on charge-redistribution A/D converters," IEEE J. Solid-State Circuits, vol. 25, pp. 1550-1561, Dec. 1990.
-
(1990)
IEEE J. Solid-state Circuits
, vol.25
, pp. 1550-1561
-
-
Fattaruso, J.W.1
De Wit, M.2
Warwar, G.3
Tan, K.-S.4
Hester, R.K.5
-
2
-
-
0030080754
-
Measurement of dielectric absorption of capacitors and analysis of its effects on VCO's
-
Feb
-
J. C. Kuenen and G.C.M. Meijer, "Measurement of dielectric absorption of capacitors and analysis of its effects on VCO's," IEEE Trans. Instrum. Meas., vol. 45, pp. 89-97, Feb. 1996.
-
(1996)
IEEE Trans. Instrum. Meas.
, vol.45
, pp. 89-97
-
-
Kuenen, J.C.1
Meijer, G.C.M.2
-
3
-
-
0035063625
-
A 14 b 40 Msample/s pipelined ADC with DFCA
-
Feb
-
P. C. Yu, S. Shehata, A. Joharapurkar, P. Chugh, A. R. Bugeja, X. Du, S.-U. Kwak, Y. Papantonopoulos, and T. Kuyel, "A 14 b 40 Msample/s pipelined ADC with DFCA," in IEEE Int. Solid-State Circuits Conf. Dig. Tech. Papers, Feb. 2001, pp. 136-137.
-
(2001)
IEEE Int. Solid-state Circuits Conf. Dig. Tech. Papers
, pp. 136-137
-
-
Yu, P.C.1
Shehata, S.2
Joharapurkar, A.3
Chugh, P.4
Bugeja, A.R.5
Du, X.6
Kwak, S.-U.7
Papantonopoulos, Y.8
Kuyel, T.9
-
4
-
-
0035060903
-
A 3 V 340 mW 14 b 75 MS/s CMOS ADC with 85 dB SFDR at Nyquist
-
Feb
-
D. Kelly, W. Yang, I. Mehr, M. Sayuk, and L. Singer, "A 3 V 340 mW 14 b 75 MS/s CMOS ADC with 85 dB SFDR at Nyquist," in IEEE Int. Solid-State Circuits Conf. Dig. Tech. Papers, Feb. 2001, pp. 134-135.
-
(2001)
IEEE Int. Solid-state Circuits Conf. Dig. Tech. Papers
, pp. 134-135
-
-
Kelly, D.1
Yang, W.2
Mehr, I.3
Sayuk, M.4
Singer, L.5
-
5
-
-
0348128237
-
A 12 b 80 MS/s pipeline ADC core with 190 mW consumption from 3 V in 0. 18 μm digital CMOS
-
Florence, Italy, Sept
-
A. Loloee, A. Zanchi, H. Jin, S. Shehata, and E. Bartolome, "A 12 b 80 MS/s pipeline ADC core with 190 mW consumption from 3 V in 0.18 μm digital CMOS," in Proc. ESSCIRC, Florence, Italy, Sept. 2002, pp. 467-470.
-
(2002)
Proc. ESSCIRC
, pp. 467-470
-
-
Loloee, A.1
Zanchi, A.2
Jin, H.3
Shehata, S.4
Bartolome, E.5
-
6
-
-
0037887692
-
-
Ph.D. dissertation, Massachusetts Inst. Technol., Cambridge, MA, June
-
T. L. Tewksbury, "Relaxation effects in MOS devices due to tunnel exchange with near-interface oxide traps," Ph.D. dissertation, Massachusetts Inst. Technol., Cambridge, MA, June 1992.
-
(1992)
Relaxation Effects in MOS Devices Due to Tunnel Exchange with Near-interface Oxide Traps
-
-
Tewksbury, T.L.1
-
7
-
-
0035718531
-
A comparative study of dielectric relaxation losses in alternative dielectrics
-
Dec
-
H. Reisinger, G. Steinlesberger, S. Jakschik, M. Gutsche, T. Hecht, M. Leonhard, U. Schröder, H. Seidl, and D. Schumann, "A comparative study of dielectric relaxation losses in alternative dielectrics," in IEDM Tech. Dig., Dec. 2001, pp. 267-270.
-
(2001)
IEDM Tech. Dig.
, pp. 267-270
-
-
Reisinger, H.1
Steinlesberger, G.2
Jakschik, S.3
Gutsche, M.4
Hecht, T.5
Leonhard, M.6
Schröder, U.7
Seidl, H.8
Schumann, D.9
-
8
-
-
0033097001
-
Experimental method for the determination of the energy distribution of stress-induced oxide traps
-
Mar
-
A. S. Spinelli, A. L. Lacaita, M. Rigamonti, and G. Ghidini, "Experimental method for the determination of the energy distribution of stress-induced oxide traps," IEEE Electron Device Lett., vol. 20, pp. 106-108, Mar. 1999.
-
(1999)
IEEE Electron Device Lett.
, vol.20
, pp. 106-108
-
-
Spinelli, A.S.1
Lacaita, A.L.2
Rigamonti, M.3
Ghidini, G.4
-
9
-
-
0035339020
-
Analog characteristics of metal-insulator-metal capacitors using PECVD nitride dielectrics
-
May
-
J. A. Babcock, S. G. Balster, A. Pinto, C. Dirnecker, P. Steinmann, R. Jumpertz, and B. El-Kareh, "Analog characteristics of metal-insulator-metal capacitors using PECVD nitride dielectrics," IEEE Electron Device Lett., vol. 22, pp. 230-232, May 2001.
-
(2001)
IEEE Electron Device Lett.
, vol.22
, pp. 230-232
-
-
Babcock, J.A.1
Balster, S.G.2
Pinto, A.3
Dirnecker, C.4
Steinmann, P.5
Jumpertz, R.6
El-Kareh, B.7
-
10
-
-
0346867743
-
-
Texas Instruments, Inc., Dallas, TX, Internal Communication, Mar
-
B. Atwell, "Dielectric absorption," Texas Instruments, Inc., Dallas, TX, Internal Communication, Mar. 2001.
-
(2001)
Dielectric Absorption
-
-
Atwell, B.1
-
11
-
-
0035306945
-
Integra-differential equation of absorptive capacitors
-
Apr
-
R. Robert and S. M. Berleze, "Integra-differential equation of absorptive capacitors," IEEE Trans. Dielect. Elect. Insulation, vol. 8, pp. 244-247, Apr. 2001.
-
(2001)
IEEE Trans. Dielect. Elect. Insulation
, vol.8
, pp. 244-247
-
-
Robert, R.1
Berleze, S.M.2
-
12
-
-
0347498285
-
An analysis of certain errors in electronic differential analyzers, II - Capacitor dielectric absorption
-
Mar
-
P. C. Dow, "An analysis of certain errors in electronic differential analyzers, II - Capacitor dielectric absorption," IRE Trans. Electron. Comput.,pp. 17-22, Mar. 1958.
-
(1958)
IRE Trans. Electron. Comput.
, pp. 17-22
-
-
Dow, P.C.1
-
13
-
-
0028384568
-
Characterization, modeling, and minimization of transient threshold voltage shifts in MOSFET's
-
Mar
-
T. L. Tewksbury and H.-S. Lee, "Characterization, modeling, and minimization of transient threshold voltage shifts in MOSFET's," IEEE J. Solid-State Circuits, vol. 28, pp. 239-252, Mar. 1994.
-
(1994)
IEEE J. Solid-state Circuits
, vol.28
, pp. 239-252
-
-
Tewksbury, T.L.1
Lee, H.-S.2
-
14
-
-
0038757998
-
Measurement and SPICE prediction of sub-picosecond clock jitter in A/D converters
-
Bangkok. Thailand
-
A. Zanchi, I. Papantonopoulos, and F. Tsay, "Measurement and SPICE prediction of sub-picosecond clock jitter in A/D converters," in Proc. IEEE Int. Symp, Circuits and Systems, vol. 5, Bangkok. Thailand, May 2003, pp. 557-560.
-
(2003)
Proc. IEEE Int. Symp, Circuits and Systems
, vol.5
, pp. 557-560
-
-
Zanchi, A.1
Papantonopoulos, I.2
Tsay, F.3
|