The focused ion beam technique: A useful tool for pharmaceutical characterization

International Journal of Pharmaceutics

Volumn 321, Issue 1-2, 2006, Pages 50-55

  Moghadam, Shadi H ^a,b   Dinarvand, Rassoul ^b   Cartilier, Louis H ^a  

^a UNIVERSITÉ DE MONTRÉAL   (Canada)

^b TEHRAN UNIVERSITY OF MEDICAL SCIENCES   (Iran)

Author keywords

Focused ion beam; Image analysis; Ion milling; Microscopy; Microspheres

Indexed keywords

MICROSPHERE; NALTREXONE; POLYLACTIDE; RESOMER;

ACCURACY; ARTICLE; DRUG DOSAGE FORM; FOCUSED ION BEAM TECHNIQUE; IMAGING; PRIORITY JOURNAL; QUALITATIVE ANALYSIS; QUANTITATIVE ANALYSIS; SAMPLE; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

MICROSCOPY, ELECTRON, TRANSMISSION; MICROSPHERES; POLYESTERS;

EID: 33747347034     PISSN: 03785173     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijpharm.2006.05.006     Document Type: Article

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