Transmission electron microscopy of fluorapatite-gelatine composite particles prepared using focused ion beam milling

Journal of Microscopy

Volumn 214, Issue 3, 2004, Pages 208-212

  Volkert, C A ^a,c   Busch, S ^b   Heiland, B ^a   Dehm, G ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b MAX PLANCK INSTITUTE FOR CHEMICAL PHYSICS OF SOLIDS   (Germany)

^c KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

Author keywords

Apatite; FIB; Focused ion beam milling; Tem sample preparation; Tooth enamel; Ultramicrotomy

Indexed keywords

APATITE; COMPOSITE MATERIALS; FOCUSED ION BEAMS; GRAIN BOUNDARIES; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IONS; MILLING (MACHINING);

COMPOSITE PARTICLES; FLUORAPATITES; FOCUSED ION BEAM MILLING; FOCUSED IONS BEAMS; GELATIN COMPOSITES; SYNTHETIC FLUORAPATITE; TEETH ENAMEL; TEM SAMPLE PREPARATION; TRANSMISSION ELECTRON MICROSCOPY OBSERVATION; ULTRA-MICROTOMY;

CRACKS;

FLUORAPATITE; GELATIN; ION;

COMPOSITE MATERIAL; CONFERENCE PAPER; FOCUSED ION BEAM MICROSCOPY; GRAIN; MICROSCOPY; PRIORITY JOURNAL; TRANSMISSION ELECTRON MICROSCOPY; ULTRAMICROTOMY;

EID: 2942571113     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.0022-2720.2004.01352.x     Document Type: Conference Paper

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