Application of a FIB-STEM system for 3D observation of a resin-embedded yeast cell

Journal of Electron Microscopy

Volumn 53, Issue 5, 2004, Pages 563-566

  Kamino, Takeo ^a   Yaguchi, Toshie ^a   Ohnishi, Tsuyoshi ^b   Ishitani, Tohru ^b   Osumi, Masako ^c,d  

^a HITACHI LTD   (Japan)

^b HITACHI HIGH TECHNOLOGIES CORPORATION   (Japan)

^c TEIKYO UNIVERSITY   (Japan)

^d JAPAN WOMEN'S UNIVERSITY   (Japan)

Author keywords

FIB microsampling technique; Focused ion beam system; Resin embedded yeast cell; Scanning transmission electron microscope; Three dimensional observation

Indexed keywords

EPOXY RESIN;

ANIMAL; ARTICLE; SCANNING TRANSMISSION ELECTRON MICROSCOPY; THREE DIMENSIONAL IMAGING; ULTRASTRUCTURE; YEAST;

ANIMALS; EPOXY RESINS; IMAGING, THREE-DIMENSIONAL; MICROSCOPY, ELECTRON, SCANNING TRANSMISSION; YEASTS;

CELL MEMBRANES; CYTOLOGY; EXTRACTION; FOCUSED ION BEAMS; RESINS; TRANSMISSION ELECTRON MICROSCOPY; YEAST;

FOCUSED ION BEAM MICROSAMPLING TECHNIQUE; FOCUSED ION BEAM MILLING; FOCUSED IONS BEAMS; FOCUSED-ION-BEAM SYSTEM; ION BEAM SCANNING; MICROSAMPLING; RESINEMBEDDED YEAST CELL; SCANNING TRANSMISSION ELECTRON MICROSCOPES; THREE-DIMENSIONAL OBSERVATIONS; YEAST CELL;

MILLING (MACHINING);

EID: 13444288244     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/jmicro/dfh063     Document Type: Article

References (11)

1. Ishitani T, Ohnishi T, Madokoro Y, and Kawanami Y (1991) Focused-ion-beam 'cutting' and 'attacker' for micro machining and device transplantation. J. Vac. Sci. Technol. B9: 2633-2637.
2. Ishitani T, Tsuboi H, Yaguchi T, and Koike H (1995) Transmission electron microscope sample preparation using a focused ion beam. J. Electron Microsc. 44: 331-336.
3. Yamaguchi A, Shibata M, and Hashinaga T (1993) Transmission electron microscopy specimen preparation technique using focused ion beam fabrication. J. Vac. Sci. Technol. B10: 575-570.
4. Kitano Y, Fujikawa Y, Takeshita H, Kamino T, Yaguchi T, Matsumoto H, and Koike H (1995) TEM observation of mechanically alloyed powder particles (MAPP) of Mg-Zn alloy thinned by FIB cutting technique. J. Electron Microsc. 44: 376-383.
5. Onishi T, Koike H, Ishitani T, Tomimatsu S, Umemura K, and Kamino T (1999) A new focused-ion beam microsampling technique for TEM observation of site-specific areas. Int. Symposium for Testing and Failure Anal. 449-453.
6. Kamino T, Yaguchi T, Ohnishi T, Umemura K, and Tomimatsu S (2000) Site specific TEM preparation using an FIB/STEM system. Microsc. Microanal. 6: 510-511.
7. Yaguchi T, Kuroda Y, Ueki Y, Kamino T, Ohnishi T, Umemura K, and Asayama K (2002) Three dimensional characterization of a specific site by an FIB microsampling technique. Microsc. Microanal. 7: 938-939.
8. Kamino T, Yaguchi T, Kuroda Y, Hashimoto T, Ohnishi T, Ishitani T, Umemura K, and Asayama K (2002) Development of a dedicated FIB system and its application. Microsc. Microanal. 8: 48-49.
9. Kamasawa N, Naito N, Kurihara T, Kamada Y, Ueda M, Tanaka A, and Osumi M (1996) Immunoelectron microscopic observation of behaviors of peroxisomal enzymes inducibly synthesized in an n-alkane-utilizable yeast cell Candida tropicalis. Cell Struct. Funct. 21: 117-122.
10. Osumi M, Miwa N, Teranishi Y, Tanaka A, and Fukui S (1974) Ultrastructure of Candida yeasts grown on n-alkanes - appearance of microbodies and their relationship to high catalase activity. Arch. Microbiol. 99: 181-201.
11. Osumi M (1998) The ultrastructure of yeast: cell wall structure and formation. Micron 29: 207-233.