메뉴 건너뛰기




Volumn 54, Issue 1, 2005, Pages 43-49

Focused ion beam preparation techniques dedicated for the fabrication of TEM lamellae of fibre-reinforced composites

Author keywords

Carbon C C; Composites; FIB; Fibre; TEM

Indexed keywords

CARBON CARBON COMPOSITES; CARBON FIBERS; FIBER REINFORCED PLASTICS; FILM PREPARATION; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; INTERFACES (MATERIALS);

EID: 19044390176     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/jmicro/dfh102     Document Type: Article
Times cited : (21)

References (8)
  • 3
    • 0000296375 scopus 로고
    • Cross-sectional transmission electron microscopy of precisely selected regions from semiconductor devices
    • Inst. Phys. Conf. Ser. no 100, section 7
    • Kirk E C G, Williams D A, and Ahmed H (1989) Cross-sectional transmission electron microscopy of precisely selected regions from semiconductor devices. In: Microscopy of Semiconducting Materials Conference, Oxford, UK, 10-13 April 1989, pp. 501-506, (Inst. Phys. Conf. Ser. no 100, section 7).
    • (1989) Microscopy of Semiconducting Materials Conference, Oxford, UK, 10-13 April 1989 , pp. 501-506
    • Kirk, E.C.G.1    Williams, D.A.2    Ahmed, H.3
  • 5
    • 0000550984 scopus 로고
    • Transmission electron microscope preparation using a focused ion beam
    • Ishitani T, Tsuboi H, Yaguchi T, and Koike H (1994) Transmission electron microscope preparation using a focused ion beam. J. Electron Microsc. 43: 322-326.
    • (1994) J. Electron Microsc. , vol.43 , pp. 322-326
    • Ishitani, T.1    Tsuboi, H.2    Yaguchi, T.3    Koike, H.4
  • 6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.