Physics-based wideband predictive compact model for inductors with high amounts of dummy metal fill

IEEE Transactions on Microwave Theory and Techniques

Volumn 54, Issue 8, 2006, Pages 3378-3386

  Tiemeijer, Luuk F ^a   Havens, Ramon J ^b   Bouttement, Yann ^b   Pranger, Henk Jan ^b  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

^b NXP SEMICONDUCTORS   (Netherlands)

Author keywords

Dummy metal fill cells; Integrated circuits (ICs); On chip inductors; On wafer microwave measurements; Tiling

Indexed keywords

CMOS INTEGRATED CIRCUITS; EDDY CURRENTS; ELECTRIC INDUCTORS; INDUCTANCE; MICROWAVES;

DUMMY METAL FILL-CELLS; ON-CHIP INDUCTORS; ON-WAFER MICROWAVE MEASUREMENTS; TILING;

BROADBAND NETWORKS;

EID: 33747301142     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2006.877831     Document Type: Article

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