Microstrip conductor loss models for electromagnetic analysis

IEEE Transactions on Microwave Theory and Techniques

Volumn 51, Issue 3, 2003, Pages 915-921

  Rautio, James C ^a,b   Demir, Veysel ^a,c  

^a Sonnet Software Inc ^*

^b Sonnet Software Inc   (United States)

^c IEEE   (United States)

Author keywords

Conductivity; Dispersion; Electromagnetic; High frequency; Loss; Microstrip; Microwave; Resistance; Skin effect; Stripline; Surface impedance

Indexed keywords

COMPUTER SOFTWARE; CURRENT DENSITY; ELECTRIC CONDUCTIVITY; ELECTRIC CURRENT DISTRIBUTION; ELECTRIC RESISTANCE; ELECTROMAGNETIC DISPERSION; MAGNETIC PERMEABILITY; MATHEMATICAL MODELS; POLYIMIDES; SEMICONDUCTING GALLIUM ARSENIDE; SKIN EFFECT; SUBSTRATES;

ELECTROMAGNETIC ANALYSIS; FREQUENCY LOSS; MICROSTRIP CONDUCTOR;

MICROSTRIP LINES;

EID: 0037358625     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2003.808693     Document Type: Article

References (13)

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