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1
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0035714864
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Record Q spiral inductors in standard CMOS
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Dec.
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L. F. Teimeijer, D. M. W. Leenaerts, N. Pavlovic, and R. J. Havens, "Record Q spiral inductors in standard CMOS," in IEDM Tech. Dig., Dec. 2001, pp. 949-952.
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(2001)
IEDM Tech. Dig.
, pp. 949-952
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Teimeijer, L.F.1
Leenaerts, D.M.W.2
Pavlovic, N.3
Havens, R.J.4
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2
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0030407071
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Monolithic spiral inductors fabricated using a VLSI Cu-Damascene interconnect technology and low-loss substrates
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J. N. Burghartz, D. C. Edelstein, K. A. Jenkins, C. Jahnes, C. Uzoh, E. J. O'Sullivan, K. K. Chan, M. Soyuer, P. Roper, and S. Cordes, "Monolithic spiral inductors fabricated using a VLSI Cu-Damascene interconnect technology and low-loss substrates," in IEDM Tech. Dig., 1996, pp. 99-102.
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(1996)
IEDM Tech. Dig.
, pp. 99-102
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Burghartz, J.N.1
Edelstein, D.C.2
Jenkins, K.A.3
Jahnes, C.4
Uzoh, C.5
O'Sullivan, E.J.6
Chan, K.K.7
Soyuer, M.8
Roper, P.9
Cordes, S.10
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3
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0012220353
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Design of wireless LAN circuits in RF-CMOS
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submitted for publication
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D. M. W. Leenaerts and N. Pavlovic, "Design of wireless LAN circuits in RF-CMOS," in Proc. AACD, 2002, submitted for publication.
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Proc. AACD, 2002
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Leenaerts, D.M.W.1
Pavlovic, N.2
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4
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0032075292
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On-chip spiral inductors with patterned ground shields for Si-based RF ICs
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May
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C. P. Yue and S. S. Wong, "On-chip spiral inductors with patterned ground shields for Si-based RF ICs," IEEE J. Solid-State Circuits, vol. 33, pp. 734-752, May 1998.
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(1998)
IEEE J. Solid-State Circuits
, vol.33
, pp. 734-752
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Yue, C.P.1
Wong, S.S.2
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5
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0003116483
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The effects of a ground shield on spiral inductors fabricated in a silicon bipolar technology
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S. Yim, T. Chen, and K. K. O, "The effects of a ground shield on spiral inductors fabricated in a silicon bipolar technology," in BCTM Tech. Dig., 2000, pp. 157-160.
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(2000)
BCTM Tech. Dig.
, pp. 157-160
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Yim, S.1
Chen, T.2
O, K.K.3
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6
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0038495596
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Impact of probe configuration and calibration techniques on quality factor determination of GHz level on-wafer inductors
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R. J. Havens, L. F. Tiemeijer, and L. Gambus, "Impact of probe configuration and calibration techniques on quality factor determination of GHz level on-wafer inductors," in Proc. ICMTS, 2002, pp. 19-24.
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Proc. ICMTS, 2002
, pp. 19-24
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Havens, R.J.1
Tiemeijer, L.F.2
Gambus, L.3
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7
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0038575149
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A calibrated lumped element de-embedding technique for on-wafer RF characterization of high-quality inductors and high-speed transistors
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submitted for publication
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L. F. Tiemeijer and R. J. Havens, "A calibrated lumped element de-embedding technique for on-wafer RF characterization of high-quality inductors and high-speed transistors," IEEE Trans. Electron Devices, submitted for publication.
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IEEE Trans. Electron Devices
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Tiemeijer, L.F.1
Havens, R.J.2
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8
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0026679924
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An improved de-embedding technique for on-wafer high-frequency characterization
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M. A. C. M. Koolen, J. A. M. Geelen, and M. P. J. G. Versleijen, "An improved de-embedding technique for on-wafer high-frequency characterization," in Proc. BCTM, 1991, pp. 188-191.
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Proc. BCTM, 1991
, pp. 188-191
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Koolen, M.A.C.M.1
Geelen, J.A.M.2
Versleijen, M.P.J.G.3
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9
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0031639792
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A Q-factor enhancement technique for MMIC inductors
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M. Danesh, J. R. Long, R. Hadaway, and D. Harame, "A Q-factor enhancement technique for MMIC inductors," in Proc. IEEE MTTS and RFIC Symp., pp. 217-220.
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Proc. IEEE MTTS and RFIC Symp.
, pp. 217-220
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Danesh, M.1
Long, J.R.2
Hadaway, R.3
Harame, D.4
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10
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0032306668
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RF circuit design aspects of spiral inductors on silicon
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Dec.
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J. N. Burghartz, D. C. Edelstein, M. Soyuer, H. A. Ainspan, and K. A. Jenkins, "RF circuit design aspects of spiral inductors on silicon," IEEE J. Solid-State Circuits, vol. 33, pp. 2028-2034, Dec. 1998.
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(1998)
IEEE J. Solid-State Circuits
, vol.33
, pp. 2028-2034
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Burghartz, J.N.1
Edelstein, D.C.2
Soyuer, M.3
Ainspan, H.A.4
Jenkins, K.A.5
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