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Volumn 23, Issue 12, 2002, Pages 713-715

Record Q symmetrical inductors for 10-GHz LC-VCOs in 0.18-μm gate-length CMOS

Author keywords

CMOS inductors; Integrated circuits (ICs); On wafer microwave measurements; Voltage controlled oscillator (LC VCO)

Indexed keywords

CAPACITORS; CMOS INTEGRATED CIRCUITS; FREQUENCY DOMAIN ANALYSIS; GATES (TRANSISTOR); INDUCTANCE MEASUREMENT; INTEGRATING CIRCUITS; LUMPED PARAMETER NETWORKS; MICROELECTRONIC PROCESSING; Q FACTOR MEASUREMENT; SEMICONDUCTOR DEVICE MODELS; VARIABLE FREQUENCY OSCILLATORS;

EID: 0036920267     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2002.805740     Document Type: Letter
Times cited : (22)

References (10)
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  • 4
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    • On-chip spiral inductors with patterned ground shields for Si-based RF ICs
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    • C. P. Yue and S. S. Wong, "On-chip spiral inductors with patterned ground shields for Si-based RF ICs," IEEE J. Solid-State Circuits, vol. 33, pp. 734-752, May 1998.
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    • Yue, C.P.1    Wong, S.S.2
  • 5
    • 0003116483 scopus 로고    scopus 로고
    • The effects of a ground shield on spiral inductors fabricated in a silicon bipolar technology
    • S. Yim, T. Chen, and K. K. O, "The effects of a ground shield on spiral inductors fabricated in a silicon bipolar technology," in BCTM Tech. Dig., 2000, pp. 157-160.
    • (2000) BCTM Tech. Dig. , pp. 157-160
    • Yim, S.1    Chen, T.2    O, K.K.3
  • 6
    • 0038495596 scopus 로고    scopus 로고
    • Impact of probe configuration and calibration techniques on quality factor determination of GHz level on-wafer inductors
    • R. J. Havens, L. F. Tiemeijer, and L. Gambus, "Impact of probe configuration and calibration techniques on quality factor determination of GHz level on-wafer inductors," in Proc. ICMTS, 2002, pp. 19-24.
    • Proc. ICMTS, 2002 , pp. 19-24
    • Havens, R.J.1    Tiemeijer, L.F.2    Gambus, L.3
  • 7
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    • A calibrated lumped element de-embedding technique for on-wafer RF characterization of high-quality inductors and high-speed transistors
    • submitted for publication
    • L. F. Tiemeijer and R. J. Havens, "A calibrated lumped element de-embedding technique for on-wafer RF characterization of high-quality inductors and high-speed transistors," IEEE Trans. Electron Devices, submitted for publication.
    • IEEE Trans. Electron Devices
    • Tiemeijer, L.F.1    Havens, R.J.2
  • 8
    • 0026679924 scopus 로고    scopus 로고
    • An improved de-embedding technique for on-wafer high-frequency characterization
    • M. A. C. M. Koolen, J. A. M. Geelen, and M. P. J. G. Versleijen, "An improved de-embedding technique for on-wafer high-frequency characterization," in Proc. BCTM, 1991, pp. 188-191.
    • Proc. BCTM, 1991 , pp. 188-191
    • Koolen, M.A.C.M.1    Geelen, J.A.M.2    Versleijen, M.P.J.G.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.