Characterization of the MIC/MILC interface and its effects on the performance of MILC thin-film transistors

IEEE Transactions on Electron Devices

Volumn 47, Issue 5, 2000, Pages 1061-1067

  Wong, Man ^a   Jin, Zhonghe ^a   Bhat, Gururaj A ^a   Wong, Philip C ^a   Kwok, Hoi Sing ^a  

^a HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

Author keywords

Grain boundary; MILC; Nickel; Thin film transistor

Indexed keywords

EID: 33747004532     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.841241     Document Type: Article

References (25)

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