Investigation on anomalous leakage currents in poly-TFT's including dynamic effects

IEEE Transactions on Electron Devices

Volumn 44, Issue 11, 1997, Pages 2106-2112

  Colalongo, Luigi ^a,b   Valdinoci, Marina ^c   Baccarani, Giorgio ^c  

^a IEEE   (Italy)

^b UNIVERSITY OF TRENTO   (Italy)

^c UNIVERSITY OF BOLOGNA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; COMPUTER SIMULATION; ELECTRIC FIELDS; GATES (TRANSISTOR); LEAKAGE CURRENTS; POLYCRYSTALLINE MATERIALS; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE STRUCTURES;

ANOMALOUS LEAKAGE CURRENTS; ENERGY DISTRIBUTED TRAPS; FIELD ENHANCED GENERATION MECHANISMS;

THIN FILM TRANSISTORS;

EID: 0031277266     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.641391     Document Type: Article

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