Comparative STM study of SPE growth of FeSi2 nanodots on Si(1 1 1)7 × 7 and Si (1 1 1) sqrt(3) × sqrt(3)-R30°-B surfaces

Surface Science

Volumn 600, Issue 12, 2006, Pages 2623-2628

  Ivanchenko, M V ^a   Borisenko, E A ^a   Kotlyar, V G ^a   Utas, O A ^a   Zotov, A V ^a   Saranin, A A ^a   Ustinov, V V ^b   Solin, N I ^b   Romashev, L N ^b   Lifshits, V G ^a  

^a INSTITUTE OF AUTOMATION AND CONTROL PROCESSES   (Russian Federation)

^b INSTITUTE OF METAL PHYSICS   (Russian Federation)

Author keywords

Atom solid interactions; Iron; Scanning tunneling microscopy (STM); Silicon; Surface structure, morphology, roughness, and topography

Indexed keywords

EPITAXIAL GROWTH; IRON COMPOUNDS; MONOLAYERS; SCANNING TUNNELING MICROSCOPY; SILICON;

ATOM-SOLID INTERACTIONS; NANODOTS; STRUCTURAL DEFECTS; SURFACE STRUCTURE, MORPHOLOGY, ROUGHNESS, AND TOPOGRAPHY;

NANOSTRUCTURED MATERIALS;

EID: 33746839248     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2006.04.032     Document Type: Article

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