Out-of-plane STM displacement measurements and evaluation of elastic fields in iron silicide islands on silicon

Physical Review B - Condensed Matter and Materials Physics

Volumn 68, Issue 7, 2003, Pages

  Manassen, Y ^a   Realpe, H ^a   Shneck, R ^a   Barlam, D ^a   Brokman, A ^b  

^a BEN GURION UNIVERSITY OF THE NEGEV   (Israel)

^b HEBREW UNIVERSITY OF JERUSALEM   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

IRON SILICIDE; SILICON; SILICON DERIVATIVE; UNCLASSIFIED DRUG;

ARTICLE; ELASTICITY; IMAGING; MEASUREMENT; SCANNING TUNNELING MICROSCOPY; STRESS; SURFACE PROPERTY;

EID: 0141454018     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.68.075412     Document Type: Article

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