Invited talk: Introduction to electromigration-aware physical design

Proceedings of the International Symposium on Physical Design

Volumn 2006, Issue , 2006, Pages 39-46

  Lienig, Jens ^a  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Current density; Electromigration; Interconnect; Interconnect reliability; Layout; Physical design

Indexed keywords

CONSTRAINT THEORY; CURRENT DENSITY; NETWORKS (CIRCUITS); PARAMETER ESTIMATION; PROBLEM SOLVING; RELIABILITY;

INTERCONNECT; INTERCONNECT RELIABILITY; LAYOUT; PHYSICAL DESIGN;

ELECTROMIGRATION;

EID: 33745943595     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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