Hierarchical Current-Density Verification in Arbitrarily Shaped Metallization Patterns of Analog Circuits

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 23, Issue 1, 2004, Pages 80-90

  Jerke, Göran ^a   Lienig, Jens ^b  

^a ROBERT BOSCH GMBH   (Germany)

^b DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Current density verification; Current driven routing; Custom circuit design; Design rule check (DRC); Electromigration; IR drop; Layout verification

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; CURRENT DENSITY; ELECTRIC FIELDS; ELECTROMIGRATION; FINITE ELEMENT METHOD; HONEYCOMB STRUCTURES; METALLIZING; PRODUCT DESIGN;

CURENT-DRIVEN ROUTING; CURRENT-DENSITY VERIFICATION; CUSTOM CIRCUIT DESIGN; DESIGN RULE CHECK (DRC); LAYOUT VERIFICATION;

INTEGRATED CIRCUITS;

EID: 0346500598     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2003.819899     Document Type: Article

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