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Volumn 213, Issue 1-2, 1997, Pages 72-79

Lateral force microscopy - A quantitative approach

(3) Gibson, Christopher T a Watson, Gregory S a Myhra, Sverre a

a GRIFFITH UNIVERSITY (Australia)

Author keywords

Calibration; Friction; Lateral force microscopy; Scanned probe microscopy

Indexed keywords

CALIBRATION; FRICTION; NANOSTRUCTURED MATERIALS; TRIBOLOGY; WEAR OF MATERIALS;

LATERAL FORCE MICROSCOPY; NANOTRIBOLOGY; SCANNED PROBE MICROSCOPY;

ATOMIC FORCE MICROSCOPY;

EID: 0031360397 PISSN: 00431648 EISSN: None Source Type: Journal
DOI: 10.1016/S0043-1648(97)00175-0 Document Type: Article

Times cited : (50)

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