High resolution non-contact AFM imaging of liquids condensed onto chemically nanopatterned surfaces

Ultramicroscopy

Volumn 106, Issue 8-9, 2006, Pages 703-708

  Checco, Antonio ^a   Cai, Yuguang ^b   Gang, Oleg ^b   Ocko, Benjamin M ^b  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

Chemical patterns; Contact angle; Line tension; Liquids; Non contact AFM; Self assembled monolayers; Wetting

Indexed keywords

ATOMIC FORCE MICROSCOPY; CONTACT ANGLE; LIQUIDS; OXIDATION; SELF ASSEMBLY; WETTING;

CHEMICAL PATTERNS; LINE TENSION; NANOLIQUIDS; NON-CONTACT AFM;

ETHANOL;

ALCOHOL; OCTANE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CONTACT ANGLE; LIQUID; MEASUREMENT; OXIDATION; POLYMERIZATION; TENSION; VAPOR;

ETHANOL; IMAGE ENHANCEMENT; MICROSCOPY, ATOMIC FORCE; NANOSTRUCTURES; OCTANES;

EID: 33745624579     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2005.11.009     Document Type: Article

References (38)

1. Magonov S., Elings V., and Whangbo M.-H. Surf. Sci. 375 (1997) L385
2. Bar G., Thomann Y., and Whangbo M.-H. Langmuir 14 (1998) 1219
3. Anselmetti D., Lüthi R., Meyer E., Richmond T., Dreier M., Frommer J., and Güntherodt H.-J. Nanotechnology 5 (1994) 87
4. Bustamante C., and Keller D. Phys. Today 48 (1995) 33
5. Lindsay S. The scanning probe microscopy in biology, in: Scanning Probe Microscopy and Spectroscopy: Theory, Techniques, and Applications. second edition (2000), Wiley, New York
6. Hu J., Xiao X.-D., Ogletree D., and Salmeron M. Science 268 (1995) 267
7. Hu J., Xiao X., and Salmeron M. Appl. Phys. Lett. 67 (1995) 476
8. Luna M., Colchero J., and Baró A.M. J. Phys. Chem. B 103 44 (1999) 9576
9. Gil A., Colchero J., Luna M., Gómez-Herrero J., and Baró A.M. Langmuir 16 (2000) 5086
10. Checco A., Daillant J., and Guenoun P. Phys. Rev. Lett. 91 (2003) 186101
11. A. Checco, H. Schollmeyer, R. Boukherroub, J. Daillant, P. Guenoun, Langmuir 22 (2006) 116.
12. Herminghaus S., Fery A., and Reims D. Ultramicroscopy 69 (1997) 211
13. Garcia R., and Perez R. Surf. Sci. Rep. 47 (2002) 197
14. Tamayo J., and Garcia R. Langmuir 12 (1996) 4430
15. Zitzler L., Herminghaus S., and Mugele F. Phys. Rev. B 66 (2002) 155436
16. Seemann R., Brinkmann M., Kramer E., Lange F., and Lipowsky R. Proc. Natl. Acad. Sci. USA 102 (2005) 1848
17. Pompe T., and Herminghaus S. Phys. Rev. Lett. 85 (2000) 1930
18. Eijkel J., and van den Berg A. Microfluidics Nanofluidics 1 (2005) 249
19. Lenz P., and Lipowsky R. Phys. Rev. Lett. 80 (1998) 1920
20. Brinkmann M., and Lipowsky R. J. Appl. Phys. 92 (2002) 4296
21. Bauer C., and Dietrich S. Phys. Rev. E 61 (2000) 1664
22. Maoz R., Cohen S., and Sagiv J. Adv. Mater. 11 (1999) 55
23. Y. Cai, A. Checco, O. Gang, B. Ocko, in preparation.
24. Noy A., Sanders C., Vezenov D., Wong S., and Lieber C. Langmuir 14 (1998) 1508
25. Bain C., Troughton E., Tao Y.T., Evall J., Whitesides G., and Nuzzo R. J. Am. Chem. Soc. 111 (1989) 321
26. Hartmann U. Ultramicroscopy 85 (1992) 1930
27. Anczykowski B., Krüger D., and Fuchs H. Phys. Rev. B 53 (1996) 15485
28. Kühle A., Sørensen A.H., and Bohr J. J. Appl. Phys. 81 (1997) 6562
29. Nony L., Boisgard R., and Aimé J.-P. J. Chem. Phys. 111 (1999) 1615
30. García R., and Paulo A.S. Phys. Rev. B 60 (1999) 4961
31. Bar G., Rubin S., Parikh A., Swanson B., Zawodzinski T.J., and Whangbo M.-H. Langmuir 13 (1997) 373
32. Haugstad G., and Jones R. Ultramicroscopy 76 (1999) 77
33. Keller D. Surf. Sci. 253 (1991) 353
34. Dobbs H. Int. J. Mod. Phys. B 13 (1999) 3255
35. Bauer C., and Dietrich S. Phys. Rev. E 62 (2000) 2428
36. Kumar A., and Whitesides G. Appl. Phys. Lett. 63 (1993) 2002
37. A. Checco, O. Gang, B.M. Ocko, Phys. Rev. Lett. 96 (2006) 056104.
38. D. Wouters, R. Willems, S. Hoeppener, C.F.J. Flipse, U.S. Schubert, Adv. Funct. Mater. 22 (2005) 938.